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ORCIDAlexander Czutro
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2010 – 2019
- 2014
[c21]Matthias Sauer, Ilia Polian, Michael E. Imhof, Abdullah Mumtaz, Eric Schneider, Alexander Czutro, Hans-Joachim Wunderlich, Bernd Becker
:
Variation-aware deterministic ATPG. ETS 2014: 1-6- [c20]Alexander Czutro, Sudhakar M. Reddy, Ilia Polian, Bernd Becker:
SAT-Based Test Pattern Generation with Improved Dynamic Compaction. VLSID 2014: 56-61 - 2013
- [b1]Alexander Czutro:
Efficiency and applications of SAT-based test pattern generation: complex fault models and optimisation problems. University of Freiburg, Der Andere Verlag 2013, ISBN 978-3-86247-388-5, pp. 1-248 - [j3]Matthias Sauer, Alexander Czutro, Tobias Schubert, Stefan Hillebrecht, Ilia Polian, Bernd Becker:
SAT-Based Analysis of Sensitizable Paths. IEEE Des. Test 30(4): 81-88 (2013) - 2012
- [c19]Alexander Czutro, Michael E. Imhof, J. Jiang, Abdullah Mumtaz, Matthias Sauer, Bernd Becker, Ilia Polian, Hans-Joachim Wunderlich:
Variation-Aware Fault Grading. Asian Test Symposium 2012: 344-349 - [c18]Jie Jiang, Matthias Sauer, Alexander Czutro, Bernd Becker, Ilia Polian:
On the optimality of K longest path generation algorithm under memory constraints. DATE 2012: 418-423 - [c17]Linus Feiten, Matthias Sauer, Tobias Schubert, Alexander Czutro, Eberhard Böhl, Ilia Polian, Bernd Becker:
#SAT-based vulnerability analysis of security components - A case study. DFT 2012: 49-54 - [c16]Alexander Czutro, Matthias Sauer, Ilia Polian, Bernd Becker:
Multi-conditional SAT-ATPG for power-droop testing. ETS 2012: 1-6 - [c15]Matthias Sauer, Alexander Czutro, Bernd Becker, Ilia Polian:
On the quality of test vectors for post-silicon characterization. ETS 2012: 1-6 - [c14]Matthias Sauer, Alexander Czutro, Ilia Polian, Bernd Becker:
Small-delay-fault ATPG with waveform accuracy. ICCAD 2012: 30-36 - [c13]Matthias Sauer, Stefan Kupferschmid, Alexander Czutro, Ilia Polian, Sudhakar M. Reddy, Bernd Becker:
Functional test of small-delay faults using SAT and Craig interpolation. ITC 2012: 1-8 - [c12]Matthias Sauer, Stefan Kupferschmid, Alejandro Czutro, Sudhakar M. Reddy, Bernd Becker:
Analysis of Reachable Sensitisable Paths in Sequential Circuits with SAT and Craig Interpolation. VLSI Design 2012: 382-387 - [c11]Alexander Czutro, Matthias Sauer, Tobias Schubert, Ilia Polian, Bernd Becker:
SAT-ATPG using preferences for improved detection of complex defect mechanisms. VTS 2012: 170-175 - 2011
- [c10]Matthias Sauer, Jie Jiang, Alejandro Czutro, Ilia Polian, Bernd Becker:
Efficient SAT-Based Search for Longest Sensitisable Paths. Asian Test Symposium 2011: 108-113 - [c9]Matthias Sauer, Alexander Czutro, Tobias Schubert, Stefan Hillebrecht, Ilia Polian, Bernd Becker:
SAT-based analysis of sensitisable paths. DDECS 2011: 93-98 - [c8]Matthias Sauer, Alejandro Czutro, Ilia Polian, Bernd Becker:
Estimation of component criticality in early design steps. IOLTS 2011: 104-110 - 2010
- [j2]Alejandro Czutro, Ilia Polian, Matthew Lewis, Piet Engelke, Sudhakar M. Reddy, Bernd Becker:
Thread-Parallel Integrated Test Pattern Generator Utilizing Satisfiability Analysis. Int. J. Parallel Program. 38(3-4): 185-202 (2010)
2000 – 2009
- 2009
- [c7]Alejandro Czutro, Ilia Polian, Piet Engelke, Sudhakar M. Reddy, Bernd Becker:
Dynamic Compaction in SAT-Based ATPG. Asian Test Symposium 2009: 187-190 - [c6]Marc Hunger, Sybille Hellebrand, Alejandro Czutro, Ilia Polian, Bernd Becker:
ATPG-based grading of strong fault-secureness. IOLTS 2009: 269-274 - [c5]Alejandro Czutro, Ilia Polian, Matthew Lewis, Piet Engelke, Sudhakar M. Reddy, Bernd Becker:
TIGUAN: Thread-Parallel Integrated Test Pattern Generator Utilizing Satisfiability ANalysis. VLSI Design 2009: 227-232 - [c4]Nicolas Houarche, Mariane Comte, Michel Renovell, Alejandro Czutro, Piet Engelke, Ilia Polian, Bernd Becker:
An Electrical Model for the Fault Simulation of Small Delay Faults Caused by Crosstalk Aggravated Resistive Short Defects. VTS 2009: 21-26 - 2008
- [c3]Alejandro Czutro, Nicolas Houarche, Piet Engelke, Ilia Polian, Mariane Comte, Michel Renovell, Bernd Becker:
A Simulator of Small-Delay Faults Caused by Resistive-Open Defects. ETS 2008: 113-118 - 2007
- [j1]Ilia Polian, Alejandro Czutro, Sandip Kundu, Bernd Becker:
Power Droop Testing. IEEE Des. Test Comput. 24(3): 276-284 (2007) - [i1]Ilia Polian, Alejandro Czutro, Bernd Becker:
Evolutionary Optimization in Code-Based Test Compression. CoRR abs/0710.4670 (2007) - 2006
- [c2]Ilia Polian, Alejandro Czutro, Sandip Kundu, Bernd Becker:
Power Droop Testing. ICCD 2006: 243-250 - 2005
- [c1]Ilia Polian, Alejandro Czutro, Bernd Becker:
Evolutionary Optimization in Code-Based Test Compression. DATE 2005: 1124-1129
Coauthor Index
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