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Books and Theses
- 2022
[b1]Alexandre Boyer:
Contributions to Computing needs in High Energy Physics Offline Activities: Towards an efficient exploitation of heterogeneous, distributed and shared Computing Resources. (Contributions aux besoins informatiques dans les activités hors-ligne du domaine de la Physique des Hautes-Énergies: Vers une exploitation efficace de ressources de calcul partagées, hétérogènes et distribuées). University of Clermont Auvergne, Clermont-Ferrand, France, 2022
Journal Articles
- 2021
- [j20]Alexandre Boyer
, Nicolas Nolhier, Fabrice Caignet, Sonia Ben Dhia:
Closed-Form Expressions of Electric and Magnetic Near-Fields for the Calibration of Near-Field Probes. IEEE Trans. Instrum. Meas. 70: 1-15 (2021) - 2018
- [j19]Nabil El Belghiti Alaoui, Alexandre Boyer, Patrick Tounsi, Arnaud Viard:
Upgrading In-Circuit Test of High Density PCBAs Using Electromagnetic Measurement and Principal Component Analysis. J. Electron. Test. 34(6): 749-762 (2018) - [j18]Nabil El Belghiti Alaoui, Alexandre Boyer, Patrick Tounsi, Arnaud Viard:
New defect detection approach using near electromagnetic field probing of high density PCBAs. Microelectron. Reliab. 88-90: 288-293 (2018) - 2015
- [j17]He Huang, Alexandre Boyer, Sonia Ben Dhia:
Electronic counterfeit detection based on the measurement of electromagnetic fingerprint. Microelectron. Reliab. 55(9-10): 2050-2054 (2015) - [j16]He Huang, Alexandre Boyer, Sonia Bendhia:
Analysis and modeling of passive device degradation for a long-term electromagnetic emission study of a DC-DC converter. Microelectron. Reliab. 55(9-10): 2061-2066 (2015) - [j15]André Durier, Alain Bensoussan, Moustafa Zerarka, Chaimae Ghfiri, Alexandre Boyer, Hélène Frémont:
A methodologic project to characterize and model COTS component reliability. Microelectron. Reliab. 55(9-10): 2097-2102 (2015) - 2014
- [j14]Alexandre Boyer, Sonia Ben Dhia:
Effect of Aging on Power Integrity and Conducted Emission of Digital Integrated Circuits. J. Low Power Electron. 10(1): 165-172 (2014) - 2013
- [j13]Sonia Ben Dhia, Alexandre Boyer:
Long-term Electro-Magnetic Robustness of Integrated Circuits: EMRIC research project. Microelectron. Reliab. 53(9-11): 1266-1272 (2013) - [j12]Jianfei Wu, Alexandre Boyer, Jiancheng Li, Sonia Bendhia, Bertrand Vrignon:
LDO regulator DC characteristic and susceptibility prediction after electrical stress ageing. Microelectron. Reliab. 53(9-11): 1273-1277 (2013) - 2012
- [j11]Sonia Ben Dhia, Alexandre Boyer, Bertrand Vrignon, Mikaël Deobarro:
IC Immunity Modeling Process Validation Using On-Chip Measurements. J. Electron. Test. 28(3): 339-348 (2012) - [j10]Alexandre Boyer, Sonia Ben Dhia, Binhong Li, Christophe Lemoine, Bertrand Vrignon:
Prediction of Long-term Immunity of a Phase-Locked Loop. J. Electron. Test. 28(6): 791-802 (2012) - [j9]Sonia Bendhia, Alexandre Boyer, Bertrand Vrignon, Mikaël Deobarro, Thanh Vinh Dinh:
On-Chip Noise Sensor for Integrated Circuit Susceptibility Investigations. IEEE Trans. Instrum. Meas. 61(3): 696-707 (2012) - 2011
- [j8]Raúl Fernández-García, Ignacio Gil, Alexandre Boyer, Sonia Bendhia, Bertrand Vrignon:
A New Approach to Modeling the Impact of EMI on MOSFET DC Behavior. IEICE Trans. Electron. 94-C(12): 1906-1908 (2011) - [j7]Tsung-Chih Lin, Ming-Jen Kuo, Alexandre Boyer:
Integrated Circuit Emission Model Extraction with a Fuzzy Logic System. Int. J. Fuzzy Syst. Appl. 1(2): 17-28 (2011) - [j6]Binhong Li, Néstor Berbel, Alexandre Boyer, Sonia Bendhia, Raúl Fernández-García:
Study of the impact of hot carrier injection to immunity of MOSFET to electromagnetic interferences. Microelectron. Reliab. 51(9-11): 1557-1560 (2011) - [j5]Néstor Berbel, Raúl Fernández-García, Ignacio Gil, Binhong Li, Alexandre Boyer, Sonia Bendhia:
Experimental verification of the usefulness of the nth power law MOSFET model under hot carrier wearout. Microelectron. Reliab. 51(9-11): 1564-1567 (2011) - 2010
- [j4]Binhong Li, Alexandre Boyer, Sonia Bendhia, Christophe Lemoine:
Ageing effect on electromagnetic susceptibility of a phase locked loop. Microelectron. Reliab. 50(9-11): 1304-1308 (2010) - 2008
- [j3]Ali Alaeldine, Nicolas Lacrampe, Alexandre Boyer, Richard Perdriau, Fabrice Caignet, Mohammed Ramdani, Etienne Sicard, M'hamed Drissi:
Comparison among emission and susceptibility reduction techniques for electromagnetic interference in digital integrated circuits. Microelectron. J. 39(12): 1728-1735 (2008) - 2003
- [j2]Frédérick Mailly, Augustin Martinez, Alain Giani, Frédérique Pascal-Delannoy, Alexandre Boyer:
Design of a micromachined thermal accelerometer: thermal simulation and experimental results. Microelectron. J. 34(4): 275-280 (2003) - [j1]R. Ondo-Ndong, G. Ferblantier, Frédérique Pascal-Delannoy, Alexandre Boyer, A. Foucaran:
Electrical properties of zinc oxide sputtered thin films. Microelectron. J. 34(11): 1087-1092 (2003)
Conference and Workshop Papers
- 2021
- [c15]Alexandre Boyer, Rami S. Abielmona, Miodrag Bolic, Emil M. Petriu:
Vessel Identification using Convolutional Neural Network-based Hardware Accelerators. CIVEMSA 2021: 1-6 - 2019
- [c14]Nabil El Belghiti Alaoui, Patrick Tounsi, Alexandre Boyer, Arnaud Viard:
Detecting PCB Assembly Defects Using Infrared Thermal Signatures. MIXDES 2019: 345-349 - 2018
- [c13]Nabil El Belghiti Alaoui, Patrick Tounsi, Alexandre Boyer, Arnaud Viard:
New testing approach using near electromagnetic field probing intending to upgrade in-circuit testing of high density PCBAs. NATW 2018: 1-8 - 2015
- [c12]Veljko Tomasevic, Alexandre Boyer, Sonia Ben Dhia:
Bandgap failure study due to parasitic bipolar substrate coupling in Smart Power mixed ICs. EMC Compo 2015: 34-38 - [c11]Alexandre Boyer, M. Cavarroc:
Enhancement of the spatial resolution of near-field immunity maps. EMC Compo 2015: 163-168 - [c10]Etienne Sicard, Alexandre Boyer, Priscila Fernandez-Lopez, An Zhou, Nicolas Marier, Frédéric Lafon:
EMC performance analysis of a processor/memory system using PCB and Package-On-Package. EMC Compo 2015: 238-243 - [c9]Abhishek Ramanujan, Etienne Sicard, Alexandre Boyer, Jean-Luc Levant, Christian Marot, Frédéric Lafon:
Developing a universal exchange format for Integrated Circuit Emission Model - Conducted Emissions. EMC Compo 2015: 252-257 - 2014
- [c8]Sonia Ben Dhia, Alexandre Boyer:
Design of on-chip sensors to monitor electromagnetic activity in ICs: Towards on-line diagnosis and self-healing. LATW 2014: 1-6 - [c7]Laurent Chusseau, Rachid Omarouayache, Jérémy Raoult, Sylvie Jarrix, Philippe Maurine, Karim Tobich, Alexandre Boyer, Bertrand Vrignon, John Shepherd, Thanh-Ha Le, Maël Berthier, Lionel Rivière, Bruno Robisson, Anne-Lise Ribotta:
Electromagnetic analysis, deciphering and reverse engineering of integrated circuits (E-MATA HARI). VLSI-SoC 2014: 1-6 - 2013
- [c6]C. Oliveira, Juliano Benfica, Letícia Maria Bolzani Poehls, Fabian Vargas, José Lipovetzky, Ariel Lutenberg, Edmundo Gatti, Fernando Hernandez, Alexandre Boyer:
Reliability analysis of an on-chip watchdog for embedded systems exposed to radiation and EMI. EMC Compo 2013: 89-94 - [c5]Alexandre Boyer, Sonia Ben Dhia:
Characterization and modeling of electrical stresses on digital integrated circuits power integrity and conducted emission. EMC Compo 2013: 190-195 - [c4]Sonia Ben Dhia, Alexandre Boyer:
Electro-magnetic robustness of integrated circuits: from statement to prediction. EMC Compo 2013: 208-213 - [c3]Alexandre Boyer, Sonia Ben Dhia:
Effect of aging on power integrity of digital integrated circuits. LATW 2013: 1-5 - 2011
- [c2]Alexandre Boyer, Sonia Ben Dhia, Binhong Li, Christophe Lemoine, Bertrand Vrignon:
Prediction of long-term immunity of a phase-locked loop. LATW 2011: 1-6 - [c1]Sonia Ben Dhia, Alexandre Boyer, Bertrand Vrignon, Mikaël Deobarro:
IC immunity modeling process validation using on-chip measurements. LATW 2011: 1-6
Coauthor Index
aka: Sonia Ben Dhia
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