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ORCIDRosa Rodríguez-Montañés
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- affiliation: Polytechnic University of Catalonia, Barcelona, Spain
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Journal Articles
- 2023
[j15]Maryam Akbari
, Sattar Mirzakuchaki, Daniel Arumí, Salvador Manich, Álvaro Gómez-Pau, Francesca Campabadal, Mireia Bargallo González, Rosa Rodríguez-Montañés:
True Random Number Generator Based on the Variability of the High Resistance State of RRAMs. IEEE Access 11: 66682-66693 (2023)- 2019
- [j14]Rosa Rodríguez-Montañés, Daniel Arumí, Joan Figueras:
Postbond Test of Through-Silicon Vias With Resistive Open Defects. IEEE Trans. Very Large Scale Integr. Syst. 27(11): 2596-2607 (2019) - 2018
- [j13]Michael Weiner, Salvador Manich, Rosa Rodríguez-Montañés, Georg Sigl:
The Low Area Probing Detector as a Countermeasure Against Invasive Attacks. IEEE Trans. Very Large Scale Integr. Syst. 26(2): 392-403 (2018) - 2016
- [j12]Daniel Arumí, Rosa Rodríguez-Montañés, Joan Figueras:
Prebond Testing of Weak Defects in TSVs. IEEE Trans. Very Large Scale Integr. Syst. 24(4): 1503-1514 (2016) - [j11]Daniel Arumí, Rosa Rodríguez-Montañés, Joan Figueras:
Test Escapes of Stuck-Open Faults Caused by Parasitic Capacitances and Leakage Currents. IEEE Trans. Very Large Scale Integr. Syst. 24(5): 1739-1748 (2016) - 2013
- [j10]Daniel Arumí, Rosa Rodríguez-Montañés, Joan Figueras, Stefan Eichenberger, Camelia Hora, Bram Kruseman:
Diagnosis of Interconnect Full Open Defects in the Presence of Gate Leakage Currents. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 32(2): 301-312 (2013) - 2011
- [j9]Daniel Arumí, Rosa Rodríguez-Montañés, Joan Figueras, Stefan Eichenberger, Camelia Hora, Bram Kruseman:
Diagnosis of Interconnect Full Open Defects in the Presence of Fan-Out. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 30(12): 1911-1922 (2011) - [j8]Daniel Arumí, Rosa Rodríguez-Montañés, Joan Figueras, Stefan Eichenberger, Camelia Hora, Bram Kruseman:
Gate Leakage Impact on Full Open Defects in Interconnect Lines. IEEE Trans. Very Large Scale Integr. Syst. 19(12): 2209-2220 (2011) - 2009
- [j7]Daniel Arumí, Rosa Rodríguez-Montañés, Joan Figueras:
Delay caused by resistive opens in interconnecting lines. Integr. 42(3): 286-293 (2009) - 2008
- [j6]Daniel Arumí, Rosa Rodríguez-Montañés, Joan Figueras:
Experimental Characterization of CMOS Interconnect Open Defects. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 27(1): 123-136 (2008) - 2004
- [j5]Rosa Rodríguez-Montañés, D. Muñoz, Luz Balado, Joan Figueras:
Analog Switches in Programmable Analog Devices: Quiescent Defective Behaviours. J. Electron. Test. 20(2): 143-153 (2004) - 2002
- [j4]Rosa Rodríguez-Montañés, Paul Volf, José Pineda de Gyvez:
Resistance Characterization for Weak Open Defects. IEEE Des. Test Comput. 19(5): 18-26 (2002) - 1998
- [j3]Antoni Ferré, Eugeni Isern, Josep Rius, Rosa Rodríguez-Montañés, Joan Figueras:
IDDQ testing: state of the art and future trends. Integr. 26(1-2): 167-196 (1998) - 1996
- [j2]Rosa Rodríguez-Montañés, E. M. J. G. Bruls, Joan Figueras:
Bridging defects resistance in the metal layer of a CMOS process. J. Electron. Test. 8(1): 35-46 (1996) - 1992
- [j1]Jaume A. Segura, Víctor H. Champac, Rosa Rodríguez-Montañés, Joan Figueras, J. A. Rubio:
Quiescent current analysis and experimentation of defective CMOS circuits. J. Electron. Test. 3(4): 337-348 (1992)
Conference and Workshop Papers
- 2022
- [c31]V. Mahboubi, Daniel Arumí, Álvaro Gómez-Pau, Rosa Rodríguez-Montañés, Salvador Manich:
On the Fitting and Improvement of RRAM Stanford-Based Model Parameters Using TiN/Ti/HfO2/W Experimental Data. DCIS 2022: 1-6 - 2021
- [c30]P. Albiol, Salvador Manich, Daniel Arumí, Rosa Rodríguez-Montañés, Álvaro Gómez-Pau:
Low Cost AES Protection Against DPA Using Rolling Codes. DCIS 2021: 1-6 - [c29]Binbin Yang, Daniel Arumí, Salvador Manich, Álvaro Gómez-Pau, Rosa Rodríguez-Montañés, Juan Bautista Roldán, Mireia Bargallo González, Francesca Campabadal, Liang Fang:
Simulation of serial RRAM cell based on a Verilog-A compact model. DCIS 2021: 1-6 - 2017
- [c28]Elena Ioana Vatajelu, Rosa Rodríguez-Montañés, Michel Renovell, Joan Figueras:
Mitigating read & write errors in STT-MRAM memories under DVS. ETS 2017: 1-2 - 2016
- [c27]Daniel Arumí, Salvador Manich, Rosa Rodríguez-Montañés:
RRAM based cell for hardware security applications. IVSW 2016: 1-6 - 2015
- [c26]Elena I. Vatajelu, Rosa Rodríguez-Montañés, Marco Indaco, Michel Renovell, Paolo Prinetto, Joan Figueras:
Read/write robustness estimation metrics for spin transfer torque (STT) MRAM cell. DATE 2015: 447-452 - [c25]Elena I. Vatajelu, Rosa Rodríguez-Montañés, Marco Indaco, Paolo Prinetto, Joan Figueras:
STT-MRAM cell reliability evaluation under process, voltage and temperature (PVT) variations. DTIS 2015: 1-6 - [c24]Elena I. Vatajelu, Rosa Rodríguez-Montañés, Stefano Di Carlo, Marco Indaco, Michel Renovell, Paolo Prinetto, Joan Figueras:
Power-aware voltage tuning for STT-MRAM reliability. ETS 2015: 1-6 - 2014
- [c23]Stefano Di Carlo, Marco Indaco, Paolo Prinetto, Elena I. Vatajelu, Rosa Rodríguez-Montañés, Joan Figueras:
Reliability estimation at block-level granularity of spin-transfer-torque MRAMs. DFT 2014: 75-80 - [c22]Rosa Rodríguez-Montañés, Daniel Arumí, Joan Figueras:
Post-bond test of Through-Silicon Vias with open defects. ETS 2014: 1-6 - [c21]Daniel Arumí, Rosa Rodríguez-Montañés, Joan Figueras:
Pre-bond testing of weak defects in TSVs. IOLTS 2014: 31-36 - 2013
- [c20]Daniel Arumí, Rosa Rodríguez-Montañés, Joan Figueras:
BIST architecture to detect defects in tsvs during pre-bond testing. ETS 2013: 1 - 2010
- [c19]Rosa Rodríguez-Montañés, Daniel Arumí, Joan Figueras, Stefan Eichenberger, Camelia Hora, Bram Kruseman:
Diagnosis of full open defects in interconnect lines with fan-out. ETS 2010: 233-238 - 2008
- [c18]Rosa Rodríguez-Montañés, Daniel Arumí, Joan Figueras, Stefan Eichenberger, Camelia Hora, Bram Kruseman:
Time-dependent Behaviour of Full Open Defects in Interconnect Lines. ITC 2008: 1-10 - [c17]Daniel Arumí, Rosa Rodríguez-Montañés, Joan Figueras, Stefan Eichenberger, Camelia Hora, Bram Kruseman:
Full Open Defects in Nanometric CMOS. VTS 2008: 119-124 - 2007
- [c16]Daniel Arumí, Rosa Rodríguez-Montañés, Joan Figueras, Stefan Eichenberger, Camelia Hora, Bram Kruseman, Maurice Lousberg, Ananta K. Majhi:
Diagnosis of Bridging Defects Based on Current Signatures at Low Power Supply Voltages. VTS 2007: 145-150 - [c15]Rosa Rodríguez-Montañés, Daniel Arumí, Joan Figueras, Stefan Eichenberger, Camelia Hora, Bram Kruseman, Maurice Lousberg, Ananta K. Majhi:
Diagnosis of Full Open Defects in Interconnecting Lines. VTS 2007: 158-166 - 2006
- [c14]Luz Balado, Emili Lupon, L. García, Rosa Rodríguez-Montañés, Joan Figueras:
Lissajous Based Mixed-Signal Testing for N-Observable Signals. DDECS 2006: 125-130 - 2005
- [c13]Daniel Arumí, Rosa Rodríguez-Montañés, Joan Figueras:
Defective behaviours of resistive opens in interconnect lines. ETS 2005: 28-33 - 2004
- [c12]Salvador Manich, L. García, Luz Balado, Emili Lupon, Josep Rius, Rosa Rodríguez-Montañés, Joan Figueras:
BIST Technique by Equally Spaced Test Vector Sequences. VTS 2004: 206-216 - 2003
- [c11]Doru P. Munteanu, Víctor Suñé, Rosa Rodríguez-Montañés, Juan A. Carrasco:
A Combinatorial Method for the Evaluation of Yield of Fault-Tolerant Systems-on-Chip. DSN 2003: 563-572 - [c10]Salvador Manich, L. García, Luz Balado, Emili Lupon, Josep Rius, Rosa Rodríguez-Montañés, Joan Figueras:
On the selection of efficient arithmetic additive test pattern generators [logic test]. ETW 2003: 9-14 - [c9]Daniel Arumí-Delgado, Rosa Rodríguez-Montañés, José Pineda de Gyvez, Guido Gronthoud:
Process-variability aware delay fault testing of ΔVT and weak-open defects. ETW 2003: 85-90 - [c8]José Pineda de Gyvez, Rosa Rodríguez-Montañés:
Threshold Voltage Mismatch (DeltaVT) Fault Modeling. VTS 2003: 145-150 - 2002
- [c7]Rosa Rodríguez-Montañés, D. Muñoz, Luz Balado, Joan Figueras:
Analog Switches in Programmable Analog Devices: Quiescent Defective Behaviours. IOLTW 2002: 99-103 - [c6]Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira, Salvador Manich, Rosa Rodríguez-Montañés, Joan Figueras:
RTL Level Preparation of High-Quality/Low-Energy/Low-Power BIST. ITC 2002: 814-823 - 1998
- [c5]Rosa Rodríguez-Montañés, Joan Figueras:
Estimation of the Defective IDDQ Caused by Shorts in Deep-Submicron CMOS ICs. DATE 1998: 490-494 - 1997
- [c4]Rosa Rodríguez-Montañés, Joan Figueras:
Bridges in sequential CMOS circuits: current-voltage signatur. VTS 1997: 68-73 - 1994
- [c3]Rosa Rodríguez-Montañés, Joan Figueras:
Analysis of Bridging Defects in Sequential CMOS Circuits and their Current Testability. EDAC-ETC-EUROASIC 1994: 356-360 - 1992
- [c2]Rosa Rodríguez-Montañés, Joan Figueras, Eric Bruls:
Bridging Defects Resistance Measurements in a CMOS Process. ITC 1992: 892-899 - 1991
- [c1]Rosa Rodríguez-Montañés, Jaume A. Segura, Víctor H. Champac, Joan Figueras, J. A. Rubio:
Current vs. Logic Testing of Gate Oxide Short, Floating Gate and Bridging Failures in CMOS. ITC 1991: 510-519
Coauthor Index
aka: Daniel Arumí-Delgado
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