ISQED 2011: Santa Clara, California, USA

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Device Aging: Analysis and Design

Analog and 3D Integrated Circuits

Low Power Circuits, Sensors, and Memories

Lithography and 3D Integration

New Ideas in Digital Design Automation

System Frameworks and Tools

Variation and Noise-Aware Design

Physical Design Issues in Custom Circuits and FPGAs

Verification, Validation and Test

Poster Session & Mixer

Variation, Reliability, and Test

Package and Processor Co-Design for Reliability and Signal/Power Integrity

System Design Considerations

Error-Resilient Design

Routing, Signal Integrity, and Timing Closure

Power Delivery and Estimation

Design Methodologies for CMOS and Beyond

Advanced Devices and Manufacturing Technologies