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ORCIDSamvel K. Shoukourian
Person information
- unicode name: Սամվել Կիմի Շուքուրյան
- affiliation: Yerevan State University
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Journal Articles
- 2021
[j10]Alexander Godlevsky, Hayk A. Grigoryan, Tigran Grigoryan, Samvel K. Shoukourian:
Some Results on Regular Events for Multitape Finite Automata: A Preliminary Report. Bull. EATCS 133 (2021)- 2020
- [j9]Hayk A. Grigoryan, Samvel K. Shoukourian:
Polynomial algorithm for equivalence problem of deterministic multitape finite automata. Theor. Comput. Sci. 833: 120-132 (2020) - [j8]Gurgen Harutyunyan
, Suren Martirosyan, Samvel K. Shoukourian, Yervant Zorian:
Memory Physical Aware Multi-Level Fault Diagnosis Flow. IEEE Trans. Emerg. Top. Comput. 8(3): 700-711 (2020) - 2019
- [j7]Gurgen Harutyunyan, Samvel K. Shoukourian, Yervant Zorian:
Fault Awareness for Memory BIST Architecture Shaped by Multidimensional Prediction Mechanism. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 38(3): 562-575 (2019) - 2012
- [j6]Gurgen Harutyunyan, Samvel K. Shoukourian, Valery A. Vardanian, Yervant Zorian:
A New Method for March Test Algorithm Generation and Its Application for Fault Detection in RAMs. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 31(6): 941-949 (2012) - 2011
- [j5]Gurgen Harutunyan, Aram Hakhumyan, Samvel K. Shoukourian, Valery A. Vardanian, Yervant Zorian:
Symmetry Measure for Memory Test and Its Application in BIST Optimization. J. Electron. Test. 27(6): 753-766 (2011) - 2008
- [j4]Haik Grigorian, Samvel K. Shoukourian:
The equivalence problem of multidimensional multitape automata. J. Comput. Syst. Sci. 74(7): 1131-1138 (2008) - 2004
- [j3]Samvel K. Shoukourian, Valery A. Vardanian, Yervant Zorian:
SoC Yield Optimization via an Embedded-Memory Test and Repair Infrastructure. IEEE Des. Test Comput. 21(3): 200-207 (2004) - 2003
- [j2]Yervant Zorian, Samvel K. Shoukourian:
Embedded-Memory Test and Repair: Infrastructure IP for SoC Yield. IEEE Des. Test Comput. 20(3): 58-66 (2003) - 1998
- [j1]Samvel K. Shoukourian:
A Unified Design Methodology for Offline and Online Testing. IEEE Des. Test Comput. 15(2): 73-79 (1998)
Conference and Workshop Papers
- 2025
- [c30]Maksim Jenihhin, Jaan Raik, Artur Jutman, Natalia Cherezova, Raimund Ubar, Liviu Miclea, Szilárd Enyedi, I. Stefan, Ovidiu Stan, Cosmina Corches, Z. Peng, Petru Eles, Rold Drechsler, S. Eggersglüß, Görschwin Fey, Andreas Glowatz, Daniel Tille, Georges G. E. Gielen, Anthony Coyette, Wim Dobbelaere, Ronny Vanhooren, P.-Y. Chuang, Erik Jan Marinissen, Giorgio Di Natale, M. Barragan, Paolo Maistri, S. Mir, Vatajelu I. Vatajelu, Paolo Bernardi, S. Di Carlo, Paolo Prinetto, Matteo Sonza Reorda, Massimo Violante, Haralampos-G. Stratigopoulos, M. K. Michael, Stelios Neophytou, Stavros Hadjitheophanous, Kyriakos Christou, M. Skitsas, Alberto Bosio, Bastien Deveautour, P. Girard, Marcello Traiola, Arnaud Virazel, F. Fernandes Dos Santos, Angeliki Kritikakou, Gioele Casagranda, Marzio Vallero, Flavio Vella, Paolo Rech, Letícia Maria Bolzani Poehls, Milos Krstic, Marko S. Andjelkovic, F. Vargas, Grigor Tshagharyan, Gurgen Harutyunyan, Valery A. Vardanian, Samvel K. Shoukourian, Yervant Zorian, Jennifer Dworak, Kundan Nepal, Theodore W. Manikas, Mottaqiallah Taouil, Moritz Fieback, Anteneh Gebregiorgis, Rajendra Bishnoi, Said Hamdioui, A. Chatterjee, A. Saha, Suhasini Komarraju, K. Ma, Chandramouli N. Amarnath, Mehdi Baradaran Tahoori, Mahta Mayahinia, Maryam Rajabalipanah, Katayoon Basharkhah, N. Nosrati, Zahra Jahanpeima, Zain Navabi, Hans-Joachim Wunderlich, Sybille Hellebrand:
European Test Symposium Teams: an Anniversary Snapshot. ETS 2025: 1-48 - 2024
- [c29]Karen Amirkhanyan, A. Babayan, Samvel K. Shoukourian, Valery A. Vardanian, Yervant Zorian:
An Approach for Increasing Memory Repair Efficiency. EWDTS 2024: 1-6 - [c28]Karen Amirkhanyan, Valery A. Vardanian, Samvel K. Shoukourian, Yervant Zorian:
Repair of Resistive Open Defects on Word-Lines and Bit-Lines of SRAMs. EWDTS 2024: 1-6 - [c27]Armen Babayan, Samvel K. Shoukourian:
Results of Validation Analysis for Multi-Memory Bus BIST Engines. EWDTS 2024: 1-3 - 2023
- [c26]Samvel K. Shoukourian, Tigran Grigoryan, Sevak Amirkhanyan:
Analytics for AI Related Applications of Multidimensional Multitape Finite Automata. CECNet 2023: 49-60 - 2019
- [c25]Gabriele Boschi, Donato Luongo, Duccio Lazzarotti, Hanna Shaheen, Hayk T. Grigoryan, Gurgen Harutyunyan, Samvel K. Shoukourian, Yervant Zorian:
Memory FIT Rate Mitigation Technique for Automotive SoCs. ITC 2019: 1-6 - [c24]Samvel K. Shoukourian, Yuri Shoukourian, Vladimir Sahakyan:
Armenia: Communicating to World Community in Electronic Test and Design. ITC 2019: 1-3 - [c23]S. Bandyopadhyay, J. Mekkoth, Marc Hutner, Hayk T. Grigoryan, Arun Kumar, Samvel K. Shoukourian, Grigor Tshagharyan, Yervant Zorian, Gabriele Boschi, Duccio Lazzarotti, Donato Luongo, Hanna Shaheen, Gurgen Harutyunyan:
Innovative Practices on In-System Test and Reliability of Memories. VTS 2019: 1 - 2018
- [c22]Hayk T. Grigoryan, Samvel K. Shoukourian, Gurgen Harutyunyan, Yervant Zorian, Costas Argyrides:
Advanced ECC-Based FIT Rate Mitigation Technique for Automotive SoCs. ITC 2018: 1-6 - 2017
- [c21]Suren Martirosyan, Gurgen Harutyunyan, Samvel K. Shoukourian, Yervant Zorian:
An efficient testing methodology for embedded flash memories. EWDTS 2017: 1-4 - [c20]D. Sargsyan, Gurgen Harutyunyan, Samvel K. Shoukourian, Yervant Zorian:
Automated flow for test pattern creation for IPs in SoC. EWDTS 2017: 1-4 - [c19]Grigor Tshagharyan, Gurgen Harutyunyan, Samvel K. Shoukourian, Yervant Zorian:
Experimental study on Hamming and Hsiao codes in the context of embedded applications. EWDTS 2017: 1-4 - 2016
- [c18]Grigor Tshagharyan, Gurgen Harutyunyan, Samvel K. Shoukourian, Yervant Zorian:
Securing test infrastructure of system-on-chips. EWDTS 2016: 1-4 - 2015
- [c17]L. Martirosyan, Gurgen Harutyunyan, Samvel K. Shoukourian, Yervant Zorian:
A power based memory BIST grouping methodology. EWDTS 2015: 1-4 - [c16]Vrezh Sargsyan, Valery A. Vardanian, Samvel K. Shoukourian, Yervant Zorian, Avetik Yessayan:
An efficient approach for memory repair by reducing the number of spares. EWDTS 2015: 1-4 - [c15]Grigor Tshagharyan, Gurgen Harutyunyan, Samvel K. Shoukourian, Yervant Zorian:
Overview study on fault modeling and test methodology development for FinFET-based memories. EWDTS 2015: 1-4 - 2014
- [c14]Gurgen Harutyunyan, Samvel K. Shoukourian, Valery A. Vardanian, Yervant Zorian:
Extending fault periodicity table for testing faults in memories under 20nm. EWDTS 2014: 1-4 - 2013
- [c13]K. Amirkhanyan, A. Davtyan, Gurgen Harutyunyan, T. Melkumyan, Samvel K. Shoukourian, Valery A. Vardanian, Yervant Zorian:
Application of defect injection flow for fault validation in memories. EWDTS 2013: 1-4 - [c12]Gurgen Harutyunyan, Samvel K. Shoukourian, Valery A. Vardanian, Yervant Zorian:
Impact of process variations on read failures in SRAMs. EWDTS 2013: 1-4 - [c11]T. Melkumyan, Gurgen Harutyunyan, Samvel K. Shoukourian, Valery A. Vardanian, Yervant Zorian:
An efficient fault diagnosis and localization algorithm for Successive-Approximation Analog to Digital Converters. EWDTS 2013: 1-4 - [c10]Gurgen Harutyunyan, Samvel K. Shoukourian, Valery A. Vardanian, Yervant Zorian:
An effective solution for building memory BIST infrastructure based on fault periodicity. VTS 2013: 1-6 - 2011
- [c9]K. Darbinyan, Gurgen Harutyunyan, Samvel K. Shoukourian, Valery A. Vardanian, Yervant Zorian:
A Robust Solution for Embedded Memory Test and Repair. Asian Test Symposium 2011: 461-462 - [c8]Hayk T. Grigoryan, Gurgen Harutunyan, Samvel K. Shoukourian, Valery A. Vardanian, Yervant Zorian:
Generic BIST architecture for testing of content addressable memories. IOLTS 2011: 86-91 - 2010
- [c7]Alexander A. Letichevsky, Arsen S. Shoukourian, Samvel K. Shoukourian:
The Equivalence Problem of Deterministic Multitape Finite Automata: A New Proof of Solvability Using a Multidimensional Tape. LATA 2010: 392-402 - 2009
- [c6]Armen Kostanyan, Vardan Matevosyan, Samvel K. Shoukourian, Anna Varosyan:
An approach for formal verification of business processes. SpringSim 2009 - 2006
- [c5]Levon Hayrapetyan, Samvel K. Shoukourian:
Alternative Combination of Processes. PDPTA 2006: 576-582 - 2004
- [c4]Samvel K. Shoukourian, Valery A. Vardanian, Yervant Zorian:
A Methodology for Design and Evaluation of Redundancy Allocation Algorithms. VTS 2004: 249-260 - 2001
- [c3]Samvel K. Shoukourian, Valery A. Vardanian, Yervant Zorian:
An Approach for Evaluation of Redunancy Analysis Algorithms. MTDT 2001: 51- - 1999
- [c2]Samvel K. Shoukourian, A. M. Vasilyan, A. A. Avagyan, A. K. Shukurian:
An Approach for Access Differentiation Design in Medical Distributed Applications Built on Databases. MIE 1999: 78-82 - 1995
- [c1]Samvel K. Shoukourian, Armen G. Kostanian, Valery A. Margarian, Ayman A. Ashour:
An approach for system tests design and its application. VTS 1995: 448-453
Editorship
- 2015
- [e1]Nelson Baloian, Yervant Zorian, Perouz Taslakian, Samvel K. Shoukourian:
Collaboration and Technology - 21st International Conference, CRIWG 2015, Yerevan, Armenia, September 22-25, 2015, Proceedings. Lecture Notes in Computer Science 9334, Springer 2015, ISBN 978-3-319-22746-7 [contents]
Coauthor Index
aka: Gurgen Harutyunyan
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