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Books and Theses
- 1976
[b1]Bernard Courtois:
Etude d'un calculateur tolérant des pannes, ses fiabilité, sécurité, performance et coût. Grenoble Institute of Technology, France, 1976
Journal Articles
- 2014
- [j31]Bernard Courtois:
Special Section NANOTECH 2013. Microelectron. J. 45(7): 930 (2014) - 2012
- [j30]Bernard Courtois:
Special section NANOTECH 2011. Microelectron. J. 43(5): 299 (2012) - 2009
- [j29]Bernard Courtois:
European Nano Systems 2007. Microelectron. J. 40(4-5): 655 (2009) - 2008
- [j28]Bernard Courtois:
European Nano Systems 2006. Microelectron. J. 39(8): 1031 (2008) - 2005
- [j27]Bernard Courtois:
Special issue on European Micro and Nano Systems (EMN04) held in Paris, 20-21 October, 2004. Microelectron. J. 36(7): 613 (2005) - 2003
- [j26]Bernard Courtois:
Infrastrukturen für Forschung und Lehre: von nationalen Initiativen zu weltweiten Entwicklungen. it Inf. Technol. 45(6): 318-326 (2003) - 2001
- [j25]Benoît Charlot, Salvador Mir, Fabien Parrain, Bernard Courtois:
Generation of Electrically Induced Stimuli for MEMS Self-Test. J. Electron. Test. 17(6): 459-470 (2001) - 2000
- [j24]Salvador Mir, Benoît Charlot, Bernard Courtois:
Extending Fault-Based Testing to Microelectromechanical Systems. J. Electron. Test. 16(3): 279-288 (2000) - [j23]Márta Rencz, Vladimír Székely, S. Török, Kholdoun Torki
, Bernard Courtois:
IDDQ Testing of Submicron CMOS - by Cooling? J. Electron. Test. 16(5): 453-461 (2000) - [j22]Raúl Andrés Bianchi, Jean-Michel Karam, Bernard Courtois:
Analog ALC crystal oscillators for high-temperature applications. IEEE J. Solid State Circuits 35(1): 2-14 (2000) - [j21]Marcelo Lubaszewski, Salvador Mir, Vladimir Kolarik, C. Nielsen, Bernard Courtois:
Design of self-checking fully differential circuits and boards. IEEE Trans. Very Large Scale Integr. Syst. 8(2): 113-128 (2000) - 1999
- [j20]Bernard Courtois, R. D. (Shawn) Blanton:
Guest Editors' Introduction. IEEE Des. Test Comput. 16(4): 16-17 (1999) - 1998
- [j19]Vladimír Székely, Márta Rencz, Bernard Courtois:
Tracing the Thermal Behavior of ICs. IEEE Des. Test Comput. 15(2): 14-21 (1998) - [j18]Vladimír Székely, Márta Rencz, Jean-Michel Karam, Marcelo Lubaszewski, Bernard Courtois:
Thermal Monitoring of Self-Checking Systems. J. Electron. Test. 12(1-2): 81-92 (1998) - [j17]Marcelo Lubaszewski, Bernard Courtois:
A Reliable Fail-Safe System. IEEE Trans. Computers 47(2): 236-241 (1998) - 1997
- [j16]Jean-Michel Karam, Bernard Courtois, Hicham Boutamine:
CAD Tools for Bridging Microsystems and Foundries. IEEE Des. Test Comput. 14(2): 34-39 (1997) - 1996
- [j15]Bozena Kaminska, Bernard Courtois:
Guest Editors' Introduction: Mixed Analog and Digital Systems. IEEE Des. Test Comput. 13(2): 8-9 (1996) - [j14]Bernard Courtois:
Second Therminic Workshop. IEEE Des. Test Comput. 13(4): 5- (1996) - [j13]Bozena Kaminska, Bernard Courtois:
Guest editorial. J. Electron. Test. 9(1-2): 7-8 (1996) - [j12]Salvador Mir, Marcelo Lubaszewski, Bernard Courtois:
Fault-based ATPG for linear analog circuits with minimal size multifrequency test sets. J. Electron. Test. 9(1-2): 43-57 (1996) - [j11]Salvador Mir, Marcelo Lubaszewski, Bernard Courtois:
Unified built-in self-test for fully differential analog circuits. J. Electron. Test. 9(1-2): 135-151 (1996) - 1995
- [j10]Sreejit Chakravarty, Ramalingam Sridhar, Shambhu J. Upadhyaya, Yervant Zorian, Gil Philips, Bozena Kaminska, Bernard Courtois:
Conference Reports. IEEE Des. Test Comput. 12(4): 95-97 (1995) - [j9]Sybille Hellebrand, Janusz Rajski, Steffen Tarnick, Srikanth Venkataraman, Bernard Courtois:
Built-In Test for Circuits with Scan Based on Reseeding of Multiple-Polynomial Linear Feedback Shift Registers. IEEE Trans. Computers 44(2): 223-233 (1995) - [j8]Vladimir Kolarik, Salvador Mir, Marcelo Lubaszewski, Bernard Courtois:
Analog checkers with absolute and relative tolerances. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 14(5): 607-612 (1995) - 1991
- [j7]Michael Nicolaidis, Kholdoun Torki, Ahmed Amine Jerraya, Bernard Courtois:
Silicon compilation of hierarchical control sections with unified BIST testability. Microprocess. Microsystems 15(5): 257-269 (1991) - 1989
- [j6]Michael Nicolaidis, Bernard Courtois:
Self-checking logic arrays. Microprocess. Microsystems 13(4): 281-290 (1989) - [j5]René David, Antoine Fuentes, Bernard Courtois:
Random Pattern Testing Versus Deterministic Testing of RAM's. IEEE Trans. Computers 38(5): 637-650 (1989) - 1988
- [j4]Ingrid Jansch, Bernard Courtois:
Definition and Design of Strongly Language Disjoint Checkers. IEEE Trans. Computers 37(6): 745-748 (1988) - [j3]Michael Nicolaidis, Bernard Courtois:
Strongly Code Disjoint Checkers. IEEE Trans. Computers 37(6): 751-756 (1988) - 1986
- [j2]Bernard Courtois, Marco Mezzalama:
Scanning the issue. Proc. IEEE 74(5): 627-628 (1986) - 1983
- [j1]Claire Rubat Du Mérac, P. Jutier, J. Laurent, Bernard Courtois:
A new domain for image analysis: VLSI circuits testing, with Romuald, specialized in parallel image processing. Pattern Recognit. Lett. 1(5-6): 347-352 (1983)
Conference and Workshop Papers
- 2019
- [c55]Max M. Shulaker, Laurent Lebrun, Bozena Kaminska, Bernard Courtois:
Special Session (New Topic): Emerging Computing and Testing Techniques. VTS 2019: 1-2 - 2018
- [c54]Carlo Reita, Jonathan Baugh, Gabriel Poulin-Lamarre, Bozena Kaminska, Bernard Courtois:
Special session on quantum systems: Next challenges in design, test, integration. VTS 2018: 1 - 2014
- [c53]Bozena Kaminska, Bernard Courtois, Chris Bailey:
New topic session 2B: Co-design and reliability of power electronic modules - Current status and future challenges. VTS 2014: 1 - [c52]Bozena Kaminska, Bernard Courtois, Mary Ann Maher:
New topic session 7B: Challenges and opportunities in test and design for test (DFT) of MEMS sensors. VTS 2014: 1 - 2013
- [c51]Marco Casale-Rossi, Alberto L. Sangiovanni-Vincentelli, Luca P. Carloni, Bernard Courtois, Hugo De Man, Antun Domic, Jan M. Rabaey:
Panel: the heritage of Mead & Conway: what has remained the same, what was missed, what has changed, what lies ahead. DATE 2013: 171-175 - [c50]Bozena Kaminska, Bernard Courtois, Massimo Alioto:
New topic session 7B: Challenges and directions for ultra-low voltage VLSI circuits and systems: CMOS and beyond. VTS 2013: 1 - [c49]Bozena Kaminska, Bernard Courtois, Soha Hassoun:
New topic session 2B: Why (Re-)Designing Biology is ∗Slightly∗ more challenging than designing electronics. VTS 2013: 1 - 2010
- [c48]Bernard Courtois:
ICs and MEMS for energy management. LATW 2010: 1 - 2009
- [c47]Bernard Courtois, Kholdoun Torki, Sophie Dumont, Sylvaine Eyraud, Jean-François Paillotin, Gregory di Pendina:
Infrastructures for Education, Research and Industry in Microelectronics A Look Worldwide and a Look at India. VLSI Design 2009: 561-566 - [c46]Bernard Courtois, Chandu Visweswariah:
Special Session 8: New Topics: At-Speed Testing in the Face of Process Variations. VTS 2009: 237 - [c45]Bernard Courtois, Ali Shakouri:
Microscale and Nanoscale Thermal Characterization of Integrated Circuit Chips. VTS 2009: 241 - 2007
- [c44]Ian O'Connor, Bernard Courtois, Krishnendu Chakrabarty, N. Delorme, M. Hampton, J. Hartung:
Heterogeneous systems on chip and systems in package. DATE 2007: 737-742 - 2006
- [c43]Bernard Courtois:
Session Abstract. VTS 2006: 150-151 - 2004
- [c42]Bernard Courtois:
Infrastructures for Education, Research and Industry in Microelectronics - A review. DELTA 2004: 149-156 - [c41]Salvador Mir, Benoît Charlot, Libor Rufer, Bernard Courtois:
On-chip testing of embedded silicon transducers. SoCC 2004: 13-18 - [c40]Salvador Mir, Libor Rufer, Bernard Courtois:
On-chip testing of embedded transducers. VLSI Design 2004: 463- - 2001
- [c39]Bernard Courtois, Salvador Mir, Benoît Charlot, Marcelo Lubaszewski:
An Analog-based Approach for MEMS Testing. LATW 2001: 200-203 - [c38]Kholdoun Torki, Bernard Courtois:
CMP: The Access to Advanced Low Costy Manufacturing. MSE 2001: 6- - [c37]Benoît Charlot, Salvador Mir, Fabien Parrain, Bernard Courtois:
Electrically Induced Stimuli For MEMS Self-Test. VTS 2001: 210-217 - 2000
- [c36]Salvador Mir, Benoît Charlot, Gabriela Nicolescu, Philippe Coste, Fabien Parrain, Nacer-Eddine Zergainoh, Bernard Courtois, Ahmed Amine Jerraya, Márta Rencz:
Towards design and validation of mixed-technology SOCs. ACM Great Lakes Symposium on VLSI 2000: 29-33 - 1999
- [c35]Salvador Mir, Benoît Charlot, Bernard Courtois:
Extending fault-based testing to microelectromechanical systems. ETW 1999: 64-68 - [c34]Benoît Charlot, Salvador Mir, Érika F. Cota, Marcelo Lubaszewski, Bernard Courtois:
Fault modeling of suspended thermal MEMS. ITC 1999: 319-328 - [c33]Kholdoun Torki, Bernard Courtois:
Advanced Low Cost Manufacturing From CMP Service. MSE 1999: 4-5 - [c32]Bernard Courtois, Jean-Michel Karam, Salvador Mir, Marcelo Lubaszewski, Vladimír Székely, Márta Rencz, Klaus Hofmann, Manfred Glesner:
Design and Test of MEMs. VLSI Design 1999: 270- - 1998
- [c31]Marcelo Lubaszewski, Érika F. Cota, Bernard Courtois:
Microsystems Testing: an Approach and Open Problems. DATE 1998: 524-528 - [c30]Selim J. Abou-Samra, P. A. Aisa, Alain Guyot, Bernard Courtois:
3D CMOS SOL for high performance computing. ISLPED 1998: 54-58 - [c29]A. Castillejo, D. Veychard, Salvador Mir, Jean-Michel Karam, Bernard Courtois:
Failure mechanisms and fault classes for CMOS-compatible microelectromechanical systems. ITC 1998: 541-550 - 1997
- [c28]Jean-Michel Karam, Bernard Courtois, Hicham Boutamine, P. Drake, András Poppe, Vladimír Székely, Márta Rencz, Klaus Hofmann, Manfred Glesner:
CAD and Foundries for Microsystems. DAC 1997: 674-679 - [c27]Klaus Hofmann, Manfred Glesner, Nicu Sebe, Anca Manuela Manolescu, Santiago Marco, Josep Samitier, Jean-Michel Karam, Bernard Courtois:
Generation of the HDL-A-model of a micromembrane from its finite-element-description. ED&TC 1997: 108-112 - [c26]Vladimír Székely, Márta Rencz, Bernard Courtois:
Integrating on-chip temperature sensors into DfT schemes and BIST architectures. VTS 1997: 440-445 - 1996
- [c25]Vladimír Székely, Márta Rencz, Jean-Michel Karam, Marcelo Lubaszewski, Bernard Courtois:
Thermal Monitoring Of Safety-Critical Integrated Systems. Asian Test Symposium 1996: 282-288 - [c24]Salvador Mir, Bernard Courtois, Marcelo Lubaszewski, Vladimir Kolarik:
Automatic Test Generation for Maximal Diagnosis of Linear Analogue Circuits. ED&TC 1996: 254-258 - [c23]Jean-Michel Karam, Bernard Courtois, M. Bauge:
High level CAD melds microsystems with foundries. ED&TC 1996: 442-447 - [c22]Jean-Michel Karam, Bernard Courtois, András Poppe, Klaus Hofmann, Márta Rencz, Manfred Glesner, Vladimír Székely:
Applied design and analysis of microsystems. ED&TC 1996: 528-532 - 1995
- [c21]Vishwani D. Agrawal, Bernard Courtois, Fumiyasu Hirose, Sandip Kundu, Chung-Len Lee, Yinghua Min, Parimal Pal Chaudhuri:
Panel: New Research Problems in the Emerging Test Technology. Asian Test Symposium 1995: 189-190 - [c20]Marcelo Lubaszewski, Vladimir Kolarik, Salvador Mir, C. Nielsen, Bernard Courtois:
Mixed-signal circuits and boards for high safety applications. ED&TC 1995: 34-41 - [c19]Khaled Saab, Bozena Kaminska, Bernard Courtois, Marcelo Lubaszewski:
Frequency-based BIST for analog circuit testin. VTS 1995: 54-59 - 1994
- [c18]Salvador Mir, Vladimir Kolarik, Marcelo Lubaszewski, C. Nielsen, Bernard Courtois:
Built-in self-test and fault diagnosis of fully differential analogue circuits. ICCAD 1994: 486-490 - [c17]Vladimir Kolarik, Marcelo Lubaszewski, Bernard Courtois:
Designing self-exercising analogue checkers. VTS 1994: 252-257 - 1993
- [c16]F. L. Vargas, Michael Nicolaidis, Bernard Courtois:
Quiescent Current Monitoring to Improve the Reliability of Electronic Systems in Space Radiation Environments. ICCD 1993: 596-600 - 1992
- [c15]Sybille Hellebrand, Steffen Tarnick, Bernard Courtois, Janusz Rajski:
Generation of Vector Patterns Through Reseeding of Multipe-Polynominal Linear Feedback Shift Registers. ITC 1992: 120-129 - [c14]Marcelo Lubaszewski, Bernard Courtois:
On the Design of Self-Checking Boundary Scannable Boards. ITC 1992: 372-381 - [c13]Ahmed Amine Jerraya, Kevin O'Brien, Inhag Park, Bernard Courtois:
Towards System level modeling and synthesis. VLSI Design 1992: 91-96 - 1991
- [c12]Vladimir Castro Alves, Michael Nicolaidis, P. Lestrat, Bernard Courtois:
Built-In Self-Test for Multi-Port RAMs. ICCAD 1991: 248-251 - [c11]M. Marzouki, J. Laurent, Bernard Courtois:
Coupling Electron-Beam Probing with Knowledge-Based Fault Localization. ITC 1991: 238-247 - 1990
- [c10]F. Darlay, Bernard Courtois:
Robust tests for stuck-open faults and design for testability of reconvergent fan-out CMOS logic networks. EURO-DAC 1990: 344-349 - [c9]Philippe Bondono, Ahmed Amine Jerraya, Armand Hornik, Bernard Courtois, D. Bonifas:
NAUTILE: a safe environment for silicon compilation. EURO-DAC 1990: 605-609 - 1989
- [c8]Michael Nicolaidis, Serge Noraz, Bernard Courtois:
A generalized theory of fail-safe systems. FTCS 1989: 398-406 - 1988
- [c7]Kholdoun Torki, Michael Nicolaidis, Ahmed Amine Jerraya, Bernard Courtois:
UBIST version of the SYCO's control section compiler. ICCD 1988: 392-396 - [c6]Jean Paul Caisso, Bernard Courtois:
Fault Simulation and Test Pattern Generation at the Multiple-Valued Switch Level. ITC 1988: 94-101 - 1986
- [c5]Ahmed Amine Jerraya, Patrick Varinot, Robert Jamier, Bernard Courtois:
Principles of the SYCO compiler. DAC 1986: 715-721 - [c4]J. Laurent, L. Bergher, Bernard Courtois, Jacques P. Collin:
Towards Automatic Failure Analysis of Complex ICs Through E-Beam Testing. ITC 1986: 465-473 - 1984
- [c3]H. Sahami, Bernard Courtois:
Functional testing vs. structural testing of RAMs. Fehlertolerierende Rechensysteme 1984: 391-403 - 1981
- [c2]Bernard Courtois:
Analytical Testing of Data Processing Sections of Integrated CPUs. ITC 1981: 21-30 - 1975
- [c1]Bernard Courtois, Gabriele Saucier:
On balancing hardware-firmware for designing a fault-tolerant computers' series. MICRO (2) 1975: 1-5
Informal and Other Publications
- 2007
- [i1]Péter G. Szabó, Balázs Németh, Márta Rencz, Bernard Courtois:
Characterisation of the Etching Quality in Micro-Electro-Mechanical Systems by Thermal Transient Methodology. CoRR abs/0711.3301 (2007)
Coauthor Index
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